The Resource Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, (electronic resource)

Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, (electronic resource)

Label
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Title
Advanced Test Methods for SRAMs
Title remainder
Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Statement of responsibility
by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Creator
Contributor
Author
Author
Subject
Language
  • eng
  • eng
Summary
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling
http://library.link/vocab/creatorName
Bosio, Alberto
Dewey number
621.3973
http://bibfra.me/vocab/relation/httpidlocgovvocabularyrelatorsaut
  • pkdS6ra_A4A
  • fm_JBcjFLyU
  • YLqDhyuMz2s
  • yLKDmnwyvvw
  • vxRO3cFLFDU
Language note
English
LC call number
TK7888.4
Literary form
non fiction
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Dilillo, Luigi.
  • Girard, Patrick.
  • Pravossoudovitch, Serge.
  • Virazel, Arnaud.
http://library.link/vocab/subjectName
  • Systems engineering
  • Computer aided design
  • Circuits and Systems
  • Computer-Aided Engineering (CAD, CAE) and Design
Label
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, (electronic resource)
Instantiates
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Content category
text
Content type code
  • txt
Contents
Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis
Dimensions
unknown
Edition
1.
Extent
1 online resource (178 p.)
Form of item
online
Isbn
9781282836716
Media category
computer
Media type code
  • c
Other control number
10.1007/978-1-4419-0938-1
Specific material designation
remote
System control number
  • (CKB)2510000000006586
  • (EBL)511613
  • (OCoLC)663093994
  • (SSID)ssj0000320860
  • (PQKBManifestationID)11256874
  • (PQKBTitleCode)TC0000320860
  • (PQKBWorkID)10258510
  • (PQKB)10109724
  • (DE-He213)978-1-4419-0938-1
  • (MiAaPQ)EBC511613
  • (EXLCZ)992510000000006586
Label
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, (electronic resource)
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Content category
text
Content type code
  • txt
Contents
Basics on SRAM Testing -- Resistive-Open Defects in Core-Cells -- Resistive-Open Defects in Pre-charge Circuits -- Resistive-Open Defects in Address Decoders -- Resistive-Open Defects in Write Drivers -- Resistive-Open Defects in Sense Amplifiers -- Faults Due to Process Variations in SRAMs -- Diagnosis and Design-for-Diagnosis
Dimensions
unknown
Edition
1.
Extent
1 online resource (178 p.)
Form of item
online
Isbn
9781282836716
Media category
computer
Media type code
  • c
Other control number
10.1007/978-1-4419-0938-1
Specific material designation
remote
System control number
  • (CKB)2510000000006586
  • (EBL)511613
  • (OCoLC)663093994
  • (SSID)ssj0000320860
  • (PQKBManifestationID)11256874
  • (PQKBTitleCode)TC0000320860
  • (PQKBWorkID)10258510
  • (PQKB)10109724
  • (DE-He213)978-1-4419-0938-1
  • (MiAaPQ)EBC511613
  • (EXLCZ)992510000000006586

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