The Resource Materials and reliability handbook for semiconductor optical and electron devices, Osamu Ueda, Stephen J. Pearton, editors, (electronic resource)

Materials and reliability handbook for semiconductor optical and electron devices, Osamu Ueda, Stephen J. Pearton, editors, (electronic resource)

Label
Materials and reliability handbook for semiconductor optical and electron devices
Title
Materials and reliability handbook for semiconductor optical and electron devices
Statement of responsibility
Osamu Ueda, Stephen J. Pearton, editors
Contributor
Subject
Genre
Language
  • eng
  • eng
Summary
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms. Provides the first handbook to cover all aspects of compound semiconductor device reliability Systematically describes research results on reliability and materials issues of both optical and electron devices developed since 2000 Covers characterization techniques needed to understand failure mechanisms in compound semiconductor devices Includes experimental approaches in reliability studies Presents case studies of laser degradation and HEMT degradation
Cataloging source
MiAaPQ
Dewey number
  • 621.381/046
  • 621.38152
Illustrations
illustrations
Index
index present
Language note
English
LC call number
TK7871.85
LC item number
.M38 2013
Literary form
non fiction
Nature of contents
  • dictionaries
  • bibliography
  • handbooks
http://library.link/vocab/relatedWorkOrContributorName
  • Ueda, Osamu
  • Pearton, S. J
http://library.link/vocab/subjectName
  • Semiconductors
  • Semiconductors
  • Semiconductors
Label
Materials and reliability handbook for semiconductor optical and electron devices, Osamu Ueda, Stephen J. Pearton, editors, (electronic resource)
Instantiates
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Content category
text
Content type code
  • txt
Contents
pt. 1. Materials issues and reliability of optical devices -- pt. 2. Materials issues and reliability of electron devices
Dimensions
unknown
Extent
1 online resource (617 p.)
Form of item
online
Isbn
9781461443377
Media category
computer
Media type code
  • c
Other control number
10.1007/978-1-4614-4337-7
Specific material designation
remote
System control number
  • (CKB)3400000000086004
  • (EBL)994639
  • (OCoLC)811565959
  • (SSID)ssj0000767085
  • (PQKBManifestationID)11513379
  • (PQKBTitleCode)TC0000767085
  • (PQKBWorkID)10748821
  • (PQKB)11322970
  • (DE-He213)978-1-4614-4337-7
  • (MiAaPQ)EBC994639
  • (EXLCZ)993400000000086004
Label
Materials and reliability handbook for semiconductor optical and electron devices, Osamu Ueda, Stephen J. Pearton, editors, (electronic resource)
Publication
Note
Description based upon print version of record
Bibliography note
Includes bibliographical references and index
Carrier category
online resource
Carrier category code
  • cr
Content category
text
Content type code
  • txt
Contents
pt. 1. Materials issues and reliability of optical devices -- pt. 2. Materials issues and reliability of electron devices
Dimensions
unknown
Extent
1 online resource (617 p.)
Form of item
online
Isbn
9781461443377
Media category
computer
Media type code
  • c
Other control number
10.1007/978-1-4614-4337-7
Specific material designation
remote
System control number
  • (CKB)3400000000086004
  • (EBL)994639
  • (OCoLC)811565959
  • (SSID)ssj0000767085
  • (PQKBManifestationID)11513379
  • (PQKBTitleCode)TC0000767085
  • (PQKBWorkID)10748821
  • (PQKB)11322970
  • (DE-He213)978-1-4614-4337-7
  • (MiAaPQ)EBC994639
  • (EXLCZ)993400000000086004

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